Available Capacitance Selection

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High-Q Multi-Layer Capacitors (RoHS)

Low ESR Capacitor, High-Q Capacitor Selection Chart

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MULTI-LAYER HIGH-Q CAPACITORS
HOW TO ORDER

LOW ESR CAPACITOR / HIGH-Q CAPACITOR SELECTION CHART

* The R05W parts, which are X7R, can only be provided with “K” tolerance. Consult factory for Non-Standard values.

*DIELECTRIC CHARACTERISTICS*	*NPO*	*X7R*
TEMPERATURE COEFFICIENT:	0 ± 30ppm /°C, -55 to 125°C	± 15%, -55 to 125°C
QUALITY FACTOR / DF:	Q >1,000 @ 1 MHz, Typical 10,000	16VDC DF≤ 3.5% @ 1 KHz, 25°C 10VDC DF≤ 5.0% @ 1 KHz, 25°C
INSULATION RESISTANCE:	>10 GΩ @ 25°C,WVDC; 125°C IR is 10% of 25°C rating	>500 ΩF* or 10 GΩ* @ 25°C,WVDC; 125°C IR is 10% of 25°C rating
DIELECTRIC STRENGTH:	2.5 X WVDC Min., 25°C, 50 mA max	* whichever is less
TEST PARAMETERS:	1MHz ±50kHz, 1.0±0.2 VRMS, 25°C	2.5 X WVDC Min., 25°C, 50 mA max 1KHz ±50Hz, 1.0±0.2 VRMS, 25°C 100 - 10,000 pF
AVAILABLE CAPACITANCE:	Size 01005: 0.2 - 10 pF Size 0201: 0.2 - 100 pF Size0402: 0.2 - 33 pF Size 0603: 0.2 - 100 pF Size 0805: 0.3 - 220 pF Size 1111: 0.2 - 1000 pF Size 2525: 1.0 - 2700 pF Size 3838: 1.0 - 5100 pF

	SPECIFICATION	TEST PARAMETERS


*MECHANICAL & ENVIRONMENTAL CHARACTERISTICS*
SOLDERABILITY:	Solder coverage ≥ 90% of metalized areas	Preheat chip to 120°-150°C for 60 sec., dip terminals in rosin flux
	No termination degradation	then dip in Sn62 solder @ 240°±5°C for 5±1 sec
RESISTANCE TO	No mechanical damage	Preheat device to 80°-100°C for 60 sec.
SOLDERING HEAT:	Capacitance change: ±2.5% or 0.25pF	followed by 150°-180°C for 60 sec.
	Q>500 I.R. >10 G Ohms	Dip in 260°±5°C solder for 10±1 sec.
	Breakdown voltage: 2.5 x WVDC	Measure after 24±2 hour cooling period
TERMINAL	Termination should not pull off.	Linear pull force* exerted on axial leads soldered to each terminal.
ADHESION:	Ceramic should remain undamaged.	*0402 ≥ 2.0lbs, 0603 ≥ 2.0lbs (min.)
PCB DEFLECTION:	No mechanical damage.	Glass epoxy PCB: 0.5 mm deflection
	Capacitance change: 2% or 0.5pF Max
LIFE TEST:	No mechanical damage	Applied voltage: 200% rated voltage, 50 mA max.
	Capacitance change: ±3.0% or 0.3 pF	Temperature: 125°±3°C
	Q>500 I.R. >1 G Ohms	Test time: 1000+48-0 hours
	Breakdown voltage: 2.5 x WVDC
THERMAL CYCLE:	No mechanical damage.	5 cycles of: 30±3 minutes @ -55°+0/-3°C,
	Capacitance change: ±2.5% or 0.25pF	2-3 min. @ 25°C, 30±3 min. @ +125°+3/-0°C,
	Q>2000 I.R. >10 G Ohms	2-3 min. @ 25°C
	Breakdown voltage: 2.5 x WVDC	Measure after 24±2 hour cooling period
HUMIDITY, STEADY STATE:	No mechanical damage. Capacitance change: ±5.0% or 0.50pF max. Q>300 I.R. ≥ 1 G-Ohm Breakdown voltage: 2.5 x WVDC	Relative humidity: 90-95% Temperature: 40°±2°C Test time: 500 +12/-0 Hours Measure after 24±2 hour cooling period
HUMIDITY,	No mechanical damage.	Applied voltage: 1.5 VDC, 50 mA max.
LOW VOLTAGE:	Capacitance change: ±5.0% or 0.50pF max.	Relative humidity: 85±2% Temperature: 40°±2°C
	Q>300 I.R. = 1 G-Ohm min.	Test time: 240 +12/-0 Hours
	Breakdown voltage: 2.5 x WVDC	Measure after 24±2 hour cooling period
VIBRATION:	No mechanical damage.
	Capacitance change: ±2.5% or 0.25pF	Cycle performed for 2 hours in each of three perpendicular directions
	Q>1000 I.R. ≥ 10 G-Ohm	Frequency range 10Hz to 55 Hz to 10 Hz traversed
	Breakdown voltage: 2.5 x WVDC	in 1 minute. Harmonic motion amplitude: 1.5mm


*MECHANICAL CHARACTERISTICS*

Size	Units	Length	Width	Thickness	End Band
01005	In	.016 ±.001	.008 ±.001	.008 ±.001	.006 Max.
(0402)	mm	(0.40 ±0.03)	(0.20 ±0.03)	(0.20 ±0.03)	(0.15 Max.)
0201	In	.024 ±.001	.012 ±.001	.012 ±.001	.008 Max.
(0603)	mm	(0.60 ±0.03)	(0.30 ±0.03)	(0.30 ±0.03)	(0.20 Max.)
0402	In	.040 ±.004	.020 ±.004	.020 ±.004	.010 ±.006
(1005)	mm	(1.02 ±0.1)	(0.51 ±0.1)	(0.51 ±0.1)	(0.25 ±.15)
0603	In	.062 ±.006	.032 ±.006	.030 +.005/-.003	.014 ±.006
(1608)	mm	(1.57 ±0.15)	(0.81 ±0.15)	(0.76 +.13-.08)	(0.35 ±.15)
0805	In	.080 ±.008	.050 ±.008	.040 ±.006	.020 ±.010
(2012)	mm	(2.03 ±0.20)	(1.27 ±0.20)	(1.02 ±.15)	(0.50 ±.25)


	Horizontal Electrode Orientation

	Vertical Electrode Orientation


*E-SERIES TERMINATIONS AND LEADS*

Termination	Size	Units	L	Tol	W	Tol	T	E / B	Tol
V,T U,C	S42E	In	0.110	+.020 -.010	0.110	+/- .015	0.102 Max.	0.015 Typ.	+/- 0.008
	S42E	mm	2.79	+0.51 -0.25	2.79	+/- 0.38	2.59 Max.	0.38 Typ.	+/- 0.20
	S48E	In	0.230	+.025 -.010	0.250	+/- .015	0.150 Max.	0.025 Typ.
	S48E	mm	5.84	+0.63 -0.25	6.35	+/- 0.38	3.81 Max.	0.63 Typ.
	S58E	In	0.380	+.015 -.010	0.380	+/- .010	0.170 Max.	0.025 Typ.
	S58E	mm	9.65	+0.38 -0.25	9.65	+/- 0.25	4.32 Max.	0.63 Typ.

For all E-Series Models:
OPERATING TEMP.:	-55 to +125°C
INSULATION RESISTANCE:	>1000 ΩF or >10 GΩ, whichever is less @ 25°C WVDC
TEMPERATURE COEFFICIENT:	± 30ppm /°C, -55 to 125°C
DISSIPATION FACTOR (TYP.):	< 0.05% @ 1 MHz

Lead	Size	Units	L	Tol	W	Tol	T (max)	E/B (typ)	LL(min)	X	Tol	e	Tol
1	S42E	In	0.135	+/- .015	0.110	+/- .020	0.120	0.015	0.25	0.093	+/-0.005	0.004	+/- 0.001
	S42E	mm	3.43	+/- 0.38	2.79	+/- 0.51	3.05	0.38	6.35	2.36	+/- 0.13	0.102	+/- 0.025
	S48E	In	0.245	+/- 0.025	0.250	+/- 0.015	0.160	0.025	0.50	0.240	+/- 0.005	0.004	+/- 0.001
	S48E	mm	6.22	+/- 0.64	6.35	+/-0.38	3.81	0.63	12.7	6.10	+/- 0.13	0.102	+/- 0.025
	S58E	In	0.38	+0.035 / - 0.010	0.38	+/- 0.010	0.170	0.04 MAX.	0.750	0.35	+/- 0.010	0.010	+/- 0.005
	S58E	mm	9.65	+0.89 / -0.25	9.65	+/- 0.25	4.32	1.02 MAX.	19.05	8.89	+/- 0.25	0.25	+/- 0.13
2	S42E	In	0.135	+/- .015	0.110	+/- .020	0.102	0.015	0.25	0.093	+/-0.005	0.004	+/- 0.001
	S42E	mm	3.43	+/- 0.38	2.79	+/- 0.51	2.59	0.38	6.35	2.36	+/- 0.13	0.102	+/- 0.025
	S48E	In	0.245	+/- 0.025	0.250	+/- 0.015	0.160	0.025	0.50	0.240	+/- 0.005	0.004	+/- 0.001
	S48E	mm	6.22	+/- 0.64	6.35	+/-0.38	3.81	0.63	12.7	6.10	+/- 0.13	0.102	+/- 0.025
	S58E	In	0.38	+0.035 / - 0.010	0.38	+/- 0.010	0.170	0.04 MAX.	0.750	0.35	+/- 0.010	0.010	+/- 0.005
	S58E	mm	9.65	+0.89 / -0.25	9.65	+/- 0.25	4.32	1.02 MAX.	19.05	8.89	+/- 0.25	0.25	+/- 0.13
3	S42E S48E S58E	In	0.145	+/- .020	0.110	+/- .015	0.102		0.50	#26 AWG, .016 (.406) dia. nominal
3	S42E S48E S58E	mm	3.68	+/- 0.51	2.79	+/- 0.38	2.59		12.70	#26 AWG, .016 (.406) dia. nominal
4	S42E S48E S58E	In	0.135	+/- .015	0.110	+/- .015	0.102		0.25	0.093	+/-0.005	0.004	+/- 0.001
4	S42E S48E S58E	mm	3.43	+/- 0.38	2.79	+/- 0.38	2.59		6.35	2.36	+/- 0.13	0.102	+/- 0.025
5	S42E S48E S58E	In	0.145	+/- .020	0.110	+/- .015	0.102		0.50	#26 AWG, .016 (.406) dia. nominal
5	S42E S48E S58E	mm	3.68	+/- 0.51	2.79	+/- 0.38	2.59		12.70	#26 AWG, .016 (.406) dia. nominal


*SERIES RESONANCE CHART* Typical Series Resonant Frequency (Series Mounted)

RF CHARACTERISTICS - L-SERIES

*S-SERIES RF CHARACTERISTICS VERSUS FREQUENCY*



Measurements performed on a Boonton 34A Resonant Coaxial Line and represent typical capacitor performance.

*S-SERIES RF CHARACTERISITCS VERSUS CAPACITANCE*



Measurements performed on a Boonton 34A Resonant Coaxial Line and represent typical capacitor performance.

S42E SERIES RF CHARACTERISTICS VERSUS FREQUENCY

S42E SERIES RF CHARACTERISTICS VERSUS CAPACITANCE

*JTI S48E GRAPHICAL DATA*
As measured on a 8720C VNA, using a Shunt-Through ﬁxture, and using the S11 magnitude dip to determine the SRF	Solid traces show voltage limited current (Vrms) Dotted traces show power dissipation limited current (Based on 4 Watts Power Dissipation, and 125 degrees C case temp.)
As measured on a 4287A LCR meter, using a 16092A fixture	As measured on a 4287A LCR meter, using a 16092A fixture